| Abstract: An apparatus for accurate measurement of surface and sub-surface
temperatures of an object from a distance without contacting the object
is provided. Illustrative embodiments provide for simultaneous
measurement of thermal emission and emissivity in the mm-wave regime
thereby enabling real-time non-contact measurement of emissivity.
Corrected temperatures for the object which may be used for calibration
of infrared thermographic cameras are determined from the measurement of
emissivity. |
| Filed: 8/8/2018 |
| Application Number: 16/58855 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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