| Abstract: The present invention includes methods and apparatus for inspecting vicinally illuminated non-patterned areas of translucent materials. An initial image of the material is received. A second image is received following a relative translation between the material being inspected and a device generating the images. Each vicinally illuminated image includes a portion having optimal illumination, that can be extracted and stored in a composite image of the non-patterned area. The composite image includes aligned portions of the extracted image portions, and provides a composite having optimal illumination over a non-patterned area of the material to be inspected. The composite image can be processed by enhancement and object detection algorithms, to determine the presence of, and characterize any inhomogeneities present in the material. |
| Filed: 12/4/2008 |
| Application Number: 12/328472 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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