| Abstract: Described herein are various technologies pertaining to identifying
counterfeit integrated circuits (ICs) by way of allowing the origin of
fabrication to be verified. An IC comprises a main circuit and a test
circuit that is independent of the main circuit. The test circuit
comprises at least one ring oscillator (RO) signal that, when energized,
is configured to output a signal that is indicative of a semiconductor
fabrication facility where the IC was manufactured. |
| Filed: 5/22/2015 |
| Application Number: 14/719535 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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