| Abstract: A method of multi-dimensional moment analysis for the characterization of
signal peaks can be used to optimize the operation of an analytical
system. With a two-dimensional Peclet analysis, the quality and signal
fidelity of peaks in a two-dimensional experimental space can be analyzed
and scored. This method is particularly useful in determining optimum
operational parameters for an analytical system which requires the
automated analysis of large numbers of analyte data peaks. For example,
the method can be used to optimize analytical systems including an ion
mobility spectrometer that uses a temperature stepped desorption
technique for the detection of explosive mixtures. |
| Filed: 6/25/2009 |
| Application Number: 12/491733 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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