Infrared detector device inspection system
| Abstract: Methods and apparatuses for identifying carrier lifetimes are disclosed herein. In a general embodiment, a beam of light is sent to a group of locations on a material for an optical device. Photons emitted from the material are detected at each of the group of locations. A carrier lifetime is identified for each of the group of locations based on the photons detected from each of the group of locations. |
| Filed: 4/17/2015 |
| Application Number: 14/689167 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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