| Abstract: The present invention relates to an in situ testing system, which
includes a wear tester and an enclosure. The wear tester is configured to
apply a normal load, by way of a tip, to a surface of the test sample.
Use of an enclosure allows such wear testing to be conducted in a
controlled environment. |
| Filed: 7/25/2017 |
| Application Number: 15/659467 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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