| Abstract: The present invention relates to a metallographic system including a
measurement module configured to provide precise differential
measurements of a sample after serial sectioning, as well as methods of
employing such a module. In particular example, the measurement module
provides differential measurement(s) without contacting the surface of a
sample, thereby minimizing contamination of the sample surface. |
| Filed: 9/14/2017 |
| Application Number: 15/705178 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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