Full-field surface roughness

Abstract: The various embodiments presented herein relate to utilizing light in conjunction with an optical Fourier transform to examine and quantify roughness of a surface. The surface includes a plurality of flaked particles. The surface is illuminated with a light beam, wherein light reflected from the surface passes through an f-theta lens and is collected at a light sensitive array (LSA). The LSA comprises light sensitive pixels. For an arrangement where the flakes are conformal with the surface, a low degree of light scattering occurs at the surface. For a surface comprising tipped and/or tilted flakes, a correlating degree of scattering of the incident light beam occurs. The surface roughness is quantified based upon the distribution of angular reflections of the scattered light represented in an image formed through use of the LSA.
Filed: 10/29/2015
Application Number: 14/927037
This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention.
Attribution for Derwent World Patents Index Records published on Sandia ® Clarivate. All rights reserved. Republication or redistribution of Clarivate content, including by framing or similar means, is prohibited without the prior written consent of Clarivate. Clarivate and its logo, as well as all other trademarks used herein are trademarks of their respective owners and used under license.