Fast electron microscopy via compressive sensing
| DWPI Title: Compressive sensing electron microscope used in neuroscience, has multi-beam generator that emits sequence of electron patterns which are complementary to linear basis in which traditional image of sample is compressible |
| Abstract: Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence. |
| Use: Compressive sensing electron microscope used in neuroscience, cell biology, microtechnologies and material science for collecting large quantities of data. |
| Advantage: The measurement is obtained by the compressive sensing electron microscope performed approximately for an individual pixel. The total imaging time is reduced significantly by employing the compressive sensing electron microscope. Since the compressive sensing electron microscope can inject fewer electrons on average to the sample, the effects of charging are mitigated as compared to existing scanning electron microscopy approaches. |
| Novelty: The microscope (102) has a multi-beam generator (106) that emits a sequence of electron patterns imparting a spatially varying electron density on a sample (104). The patterns are complementary to a linear basis in which a traditional image of sample is compressible. A detector (110) collects signals respectively corresponding to interactions between sample and patterns. A collection component (404) obtains measurement data from signals respectively. A reconstruction component (406) employs a compressive sensing reconstruction algorithm to generate an image based on measurement data. |
| Filed: 9/19/2012 |
| Application Number: US13622943A |
| Tech ID: SD 12174.0 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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