Method of intrinsic marking
| DWPI Title: Intrinsic marking useful for detecting tampering or counterfeiting involves irradiating substrate surface with laser pulse to form color patterns, where the substrate comprises a solder, a braze alloy or silicon |
| Abstract: A method of pulsed laser intrinsic marking can provide a unique identifier to detect tampering or counterfeiting. |
| Use: For intrinsic marking (claimed) for detecting tampering or counterfeiting. |
| Advantage: The present method of pulsed laser intrinsic marking provides a unique identifier on a substrate to indicate tampering or counterfeiting. |
| Novelty: Intrinsic marking involves irradiating the surface of a substrate with at least one laser pulse to form at least one color pattern on the surface, where the substrate comprises a solder, a braze alloy or silicon. |
| Filed: 2/23/2012 |
| Application Number: US13403117A |
| Tech ID: SD 11805.1 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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