Temperature dependent x-ray fluorescence

DWPI Title: Method of determining temperature according to X-ray fluorescence of materials involves determining temperature of sample according to a predetermined relationship between photon fluorescence and temperature for material
Abstract: A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.
Use: Method of determining temperature according to X-ray fluorescence of materials.
Advantage: The use of an X-ray source for excitation allows for simultaneous X-ray probing and temperature measurement of a sample.
Novelty: The method involves irradiating, by an X-ray source (150), a sample (132) of a material with X-rays, and detecting, by a number of photon detectors, photon fluorescence 9140) produced by the sample in response to the X-ray irradiation. Processors determine a temperature (138) of the sample according to a predetermined relationship between photon fluorescence and temperature for the material. The sample comprises a thermographic material. Photon fluorescence produced by the sample is X-ray fluorescence. Photon fluorescence produced by the sample is visual fluorescence.
Filed: 10/24/2019
Application Number: US16662669A
Tech ID: SD 15082.0
This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention.
Data from Derwent World Patents Index, provided by Clarivate
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