Systems and methods for screening particle source manufacturing and development test data
| DWPI Title: System for evaluating test data of particle source e.g. electron source, photon source, neutron source and x-ray source, has processor for identifying sub-optimal behavior exhibited by particle source when processor detects that test data is abnormal based upon test data |
| Abstract: A computing system obtains test data for a particle source. The test data was generated by the particle source when the particle source was caused to emit particles. The test data comprises a first set of measurements of a first type and a second set of measurements of a second type. The computing system applies a data agnostic predictive model to the test data. The data agnostic predictive model is generated without a parametric analysis of variables of the first type and variables of the second type. The data agnostic predictive model outputs, based upon the test data, a value that is indicative of whether or not the test data is abnormal. Based upon the value, the computing system outputs an indication that the particle source was operating sub-optimally when emitting the particles. |
| Use: System for evaluating test data of a particle source e.g. electron source, photon source, neutron source and x-ray source. |
| Advantage: The system reduces human engineering resources required to review the test data and enables early detection of trends which would normally be difficult to detect in the manufacturing process for the particle source. The computing system may be used in a manufacturing process of the particle sources in order to identify and eliminate particle sources that exhibit sub-optimal behavior while operating and/or improve a design of the particles sources. |
| Novelty: The system (100) has a memory (104) for storing instructions that cause a processor (102) to obtain test data for a particle source, where the test data is associated with the particle source when the source is caused to emit particles. The test data comprises two sets of measurements of two types, where one set of measurements comprises voltage data of the source and the other set comprises electrical current data. A data agnostic predictive model (110) is applied to the data, and outputs a value that is indicative of whether or not the data is abnormal. An indication that the source operates sub-optimally is output based upon the value. |
| Filed: 2/10/2021 |
| Application Number: US17172353A |
| Tech ID: SD 15167.1 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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