Test circuits for integrated circuit counterfeit detection
| Patent Number: | 10,254,334 |
| Issued: | 4/9/2019 |
| Official Filing: | View the Complete Patent |
| Abstract: | Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured. |
| Filed: | 7/24/2018 |
| Application Number: | 16/44,007 |
| Government Interests: | STATEMENT OF GOVERNMENT INTEREST This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |