Systems and methods for screening particle source manufacturing and development test data

Patent Number: 11719727
Issued: 8/8/2023
Official Filing: View the Complete Patent
Abstract: A computing system obtains test data for a particle source. The test data was generated by the particle source when the particle source was caused to emit particles. The test data comprises a first set of measurements of a first type and a second set of measurements of a second type. The computing system applies a data agnostic predictive model to the test data. The data agnostic predictive model is generated without a parametric analysis of variables of the first type and variables of the second type. The data agnostic predictive model outputs, based upon the test data, a value that is indicative of whether or not the test data is abnormal. Based upon the value, the computing system outputs an indication that the particle source was operating sub-optimally when emitting the particles.
Filed: 2/10/2021
Government Interests: STATEMENT OF GOVERNMENT INTEREST This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention.