| Abstract: A device sample is screened for defects using its power spectrum in
response to a dynamic stimulus. The device sample receives a time-varying
electrical signal. The power spectrum of the device sample is measured at
one of the pins of the device sample. A defect in the device sample can
be identified based on results of comparing the power spectrum with one
or more power spectra of the device that have a known defect status. |
| Filed: 12/1/2011 |
| Application Number: 13/309281 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
| Attribution for Derwent World Patents Index Records published on Sandia ® Clarivate. All rights reserved. Republication or redistribution of Clarivate content, including by framing or similar means, is prohibited without the prior written consent of Clarivate. Clarivate and its logo, as well as all other trademarks used herein are trademarks of their respective owners and used under license. |