|Abstract: ||An apparatus for accurate measurement of surface and sub-surface
temperatures of an object from a distance without contacting the object
is provided. Illustrative embodiments provide for simultaneous
measurement of thermal emission and emissivity in the mm-wave regime
thereby enabling real-time non-contact measurement of emissivity.
Corrected temperatures for the object which may be used for calibration
of infrared thermographic cameras are determined from the measurement of