|Abstract: ||An integrated transmission electron microscope comprising multiple
electron sources for tuned beams of ultrafast, scanning probe, and
parallel illumination in varied beam energies can be alternated within
sub-microseconds onto a sample with dynamic `transient state` processes
to acquire atomic-scale structural/chemical data with site specificity.
The various electron sources and condenser optics enable high-resolution
imaging, high-temporal resolution imaging, and chemical imaging, using
fast-switching magnets to direct the different electron beams onto a
single maneuverable objective pole piece where the sample resides. Such
multimodal in situ characterization tools housed in a single microscope
have the potential to revolutionize materials science.