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Passive millimeter wave radiometer system for calibration of infrared cameras

United States Patent

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December 29, 2020
View the Complete Patent at the US Patent & Trademark Office
An apparatus for accurate measurement of surface and sub-surface temperatures of an object from a distance without contacting the object is provided. Illustrative embodiments provide for simultaneous measurement of thermal emission and emissivity in the mm-wave regime thereby enabling real-time non-contact measurement of emissivity. Corrected temperatures for the object which may be used for calibration of infrared thermographic cameras are determined from the measurement of emissivity.
16/ 058,855
August 8, 2018
G01K 1/00 (20060101)G01J 5/00 (20060101)G01K 15/00 (20060101)G01J 5/02 (20060101)H04N 5/33 (20060101)
STATEMENT OF GOVERNMENT INTEREST This invention was made with United States Government support under Contract No. DE-NA0003525 between National Technology & Engineering Solutions of Sandia, LLC and the United States Department of Energy. The United States Government has certain rights in this invention.