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Global analysis peak fitting for chemical spectroscopy data

United States Patent

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February 4, 2020
View the Complete Patent at the US Patent & Trademark Office
The present invention relates to methods for analyzing a chemical sample. For instance, the methods herein allow for global analysis of spectroscopy data in order to extract useful chemical properties from complicated multidimensional data. Such analysis can optionally employ data compression to further expedite computer-implemented computation. In particular, the methods herein provide global analysis of data matrices explained by both linear and non-linear terms.
15/ 082,922
March 28, 2016
G01J 3/42 (20060101)G01N 21/31 (20060101)G01N 21/64 (20060101)G01N 23/083 (20180101)
STATEMENT OF GOVERNMENT INTEREST This invention was made with Government support under contract no. DE-AC04-94AL85000 awarded by the U.S. Department of Energy to Sandia Corporation. The Government has certain rights in the invention.