| Abstract: | An apparatus and method for preparing Double Cantilever Beam (DCB)
specimens are disclosed as an apparatus and method for conducting Mode I
fracture resistance testing using the DCB specimens. In a first
embodiment, a drill jig is used to locate the DCB specimen and guide a
drilling process during creation of at least one through-hole in the DCB
specimen. The drilling process may employ a traditional drill and drill
bit, a laser drill, or a water jet. In another embodiment, a set of
rotating pin blocks, each with a full-round or a half-round specimen pin
at one end and a hanger full-round pin at the other end, engage the DCB
specimen and facilitate the internal application of a fracturing load to
the DCB specimen for the Mode I fracture resistance test. The present
invention may significantly reduce the time and materials needed to
prepare and test a DCB specimen. |