Temperature dependent x-ray fluorescence
| Patent Number: | 11,079,287 |
| Issued: | 8/3/2021 |
| Official Filing: | View the Complete Patent |
| Abstract: | A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material. |
| Filed: | 10/24/2019 |
| Application Number: | 16/662,669 |
| Government Interests: | STATEMENT OF GOVERNMENT INTEREST This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |