| Abstract: A method and system for determining temperature are provided. The method
comprises using an x-ray source to irradiate a sample of a material with
x-rays. Photon fluorescence produced by the sample in response to the
x-ray irradiation is detected by a number of photon detectors. Based on
the detected fluorescence a temperature of the sample is determined
according to a predetermined relationship between photon fluorescence and
temperature for the material. |
| Filed: 10/24/2019 |
| Application Number: 16/662669 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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