| Abstract: An integrated transmission electron microscope comprising multiple
electron sources for tuned beams of ultrafast, scanning probe, and
parallel illumination in varied beam energies can be alternated within
sub-microseconds onto a sample with dynamic `transient state` processes
to acquire atomic-scale structural/chemical data with site specificity.
The various electron sources and condenser optics enable high-resolution
imaging, high-temporal resolution imaging, and chemical imaging, using
fast-switching magnets to direct the different electron beams onto a
single maneuverable objective pole piece where the sample resides. Such
multimodal in situ characterization tools housed in a single microscope
have the potential to revolutionize materials science. |
| Filed: 9/28/2020 |
| Application Number: 17/35267 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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