| Abstract: A visualization method for screening electronic devices is provided. In
accordance with the disclosed method, a probe is applied to a grid of
multiple points on the circuit, and an output produced by the circuit in
response to the stimulus waveform is monitored for each of multiple grid
points where the probe is applied. A power spectrum analysis (PSA)
produces a power spectrum amplitude, in each of one or more frequency
bins, on the monitored output for each of the multiple grid points. The
PSA provides a respective pixel value for each of the multiple grid
points. An image is displayed, in which image portions representing the
multiple grid points are displayed with the respective pixel values. |
| Filed: 7/13/2016 |
| Application Number: 15/208931 |
| This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention. |
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