| Abstract: | An apparatus for detecting radiation is provided. In embodiments, at
least one sensor is disposed on a surface of a wafer-like substrate. At
least one sensor medium is fixed relative to the substrate, optically or
electrically coupled to the sensor, and separated from the sensor by no
more than the substrate thickness. An electronic signal-processing
circuit is connected to the sensor and configured to produce an output
when the sensor is stimulated by a product of an interaction between the
sensor medium and impinging radiation. The sensor is configured to
collect, from the sensor medium, charge and/or light produced within the
sensor medium by interactions with impinging radiation. |