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Apparatus for high-throughput sequential tensile testing and methods thereof

United States Patent

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May 11, 2021
View the Complete Patent at the US Patent & Trademark Office
The present invention relates, in part, to an apparatus configured to test a plurality of test samples within a sample cartridge. Such an apparatus can facilitate high-throughput tensile testing of such test samples. Also described herein are methods for using such an apparatus and for testing such test samples.
16/ 506,779
July 9, 2019
G01N 3/08 (20060101)G01N 3/02 (20060101)B33Y 80/00 (20150101)
STATEMENT OF GOVERNMENT INTEREST This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention.