Apparatus for high-throughput sequential tensile testing and methods thereof

Patent Number: 11,002,649
Issued: 5/11/2021
Official Filing: View the Complete Patent
Abstract: The present invention relates, in part, to an apparatus configured to test a plurality of test samples within a sample cartridge. Such an apparatus can facilitate high-throughput tensile testing of such test samples. Also described herein are methods for using such an apparatus and for testing such test samples.
Filed: 7/9/2019
Application Number: 16/506,779
Government Interests: STATEMENT OF GOVERNMENT INTEREST This invention was made with Government support under Contract No. DE-NA0003525 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention.